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In situ high temperature microwave microscope for nondestructive detection of surface and sub-surface defects
Wang, Peiyu, Li, Zhencheng, Pei, YongmaoVolume:
26
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.26.009595
Date:
April, 2018
File:
PDF, 3.35 MB
english, 2018