Calibration sample for arbitrary metrological...

Calibration sample for arbitrary metrological characteristics of optical topography measuring instruments

Eifler, Matthias, Hering, Julian, von Freymann, Georg, Seewig, Jörg
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Volume:
26
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.26.016609
Date:
June, 2018
File:
PDF, 4.36 MB
english, 2018
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