Antireflection self-reference method based on ultrathin...

Antireflection self-reference method based on ultrathin metallic nanofilms for improving terahertz reflection spectroscopy

Lai, Weien, Cao, Haibing, Yang, Jun, Deng, Guangsheng, Yin, Zhiping, Zhang, Qian, Pelaz, Beatriz, del Pino, Pablo
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Volume:
26
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.26.019470
Date:
July, 2018
File:
PDF, 2.35 MB
english, 2018
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