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SPECT imaging with off-set detector system: Comparison of sampling angles 2, 4 and 6 degrees
Yasuyuki Takahashi, Kenya Murase, Hiroshi Higashino, Hideo Kawakami, Isao KawamataVolume:
16
Language:
english
Pages:
5
DOI:
10.1007/bf02988623
Date:
July, 2002
File:
PDF, 1001 KB
english, 2002