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[IEEE 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Dresden (2018.3.19-2018.3.23)] 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Technology mapping flow for emerging reconfigurable silicon nanowire transistors
Rai, Shubham, Raitza, Michael, Kumar, AkashYear:
2018
Language:
english
DOI:
10.23919/DATE.2018.8342110
File:
PDF, 308 KB
english, 2018