Fault tolerant adaptive write schemes for improving...

AEU - International Journal of Electronics and Communications 2018 / 09 Vol. 94

Fault tolerant adaptive write schemes for improving endurance and reliability of memristor memories

Ravi, V., Prabaharan, S.R.S.
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Volume:
94
Language:
english
Journal:
AEU - International Journal of Electronics and Communications
DOI:
10.1016/j.aeue.2018.07.023
Date:
September, 2018
File:
PDF, 1.63 MB
english, 2018
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