Wavelength measurement by Fourier analysis of interference fringes through a plane parallel plate
Lee, Choonghwan, Choi, Heejoo, Kim, Jiung, Cha, Myoungsik, Jin, JonghanVolume:
56
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.56.009638
Date:
December, 2017
File:
PDF, 1021 KB
english, 2017