Dynamic study of secondary recrystallization of 3% Si-Fe by synchrotron x-radiation topography
Y. Ushigami, Y. Suga, N. Takahashi, K. Kawasaki, Y. Chikaura, H. KiiVolume:
13
Language:
english
Pages:
6
DOI:
10.1007/bf02995815
Date:
June, 1991
File:
PDF, 1.98 MB
english, 1991