Laser wavelength metrology with color sensor chips

Optics Express 2015 / 12 Vol. 23; Iss. 25

Laser wavelength metrology with color sensor chips

Jones, Tyler B., Otterstrom, Nils, Jackson, Jarom, Archibald, James, Durfee, Dallin S.
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Volume:
23
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.23.032471
Date:
December, 2015
File:
PDF, 795 KB
english, 2015
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