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Superresolution reflection microscopy via absorbance modulation: a theoretical study
Kowarsch, Robert, Geisler, Claudia, Egner, Alexander, Rembe, ChristianVolume:
26
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.26.005327
Date:
March, 2018
File:
PDF, 5.12 MB
english, 2018