![](/img/cover-not-exists.png)
Wavelength-dispersed optical-line scanning super-resolution interferometry for fast measurement of precision surface
Wang, Hui, Xie, Fang, Ma, Sen, Wang, Yunzhi, Dong, Lianlian, Xu, HengxiaoVolume:
111
Language:
english
Journal:
Optics and Lasers in Engineering
DOI:
10.1016/j.optlaseng.2018.07.011
Date:
December, 2018
File:
PDF, 2.13 MB
english, 2018