Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
2018 / 05 Vol. 36; Iss. 3
Direct metal etch of ruthenium for advanced interconnect
Paolillo, Sara, Wan, Danny, Lazzarino, Frédéric, Rassoul, Nouredine, Piumi, Daniele, Tőkei, ZsoltVolume:
36
Language:
english
Journal:
Journal of Vacuum Science & Technology B
DOI:
10.1116/1.5022283
Date:
May, 2018
File:
PDF, 2.45 MB
english, 2018