Microsphere-assisted phase-shifting profilometry

Applied Optics 2017 / 09 Vol. 56; Iss. 25

Microsphere-assisted phase-shifting profilometry

Perrin, Stephane, Leong-Hoï, Audrey, Lecler, Sylvain, Pfeiffer, Pierre, Kassamakov, Ivan, Nolvi, Anton, Hæggström, Edward, Montgomery, Paul
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Volume:
56
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.56.007249
Date:
September, 2017
File:
PDF, 1.49 MB
english, 2017
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