Correction of interferogram data acquired using a focal plane FT-IR spectrometer system
Gao, Cong, Mao, Jianhua, Chen, RenVolume:
57
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.57.002434
Date:
April, 2018
File:
PDF, 1.76 MB
english, 2018