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High-accuracy measurement of the focal length and distortion of optical systems based on interferometry
Yang, Guoqing, Miao, Liang, Zhang, Xin, Sun, Chuang, Qiao, YanfengVolume:
57
Language:
english
Journal:
Applied Optics
DOI:
10.1364/AO.57.005217
Date:
June, 2018
File:
PDF, 1.25 MB
english, 2018