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C-DLTS interface defects in Al 0.22 Ga 0.78 N/GaN HEMTs on SiC: Spatial location of E2 traps
Jabbari, I., Baira, M., Maaref, H., Mghaieth, R.Volume:
104
Language:
english
Journal:
Physica E: Low-dimensional Systems and Nanostructures
DOI:
10.1016/j.physe.2018.07.035
Date:
October, 2018
File:
PDF, 1.74 MB
english, 2018