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[IEEE 2018 17th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - San Diego, CA, USA (2018.5.29-2018.6.1)] 2018 17th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - CTE-matched Cantilevers for Improved Heated Atomic Force Microscopy and Passive-mode Scanning Thermal Microscopy
Sharar, Darin J., Wilson, Adam A.Year:
2018
Language:
english
DOI:
10.1109/ITHERM.2018.8419532
File:
PDF, 450 KB
english, 2018