Enhanced model for determining the number of graphene...

Beilstein Journal of Nanotechnology 2015 / 11 Vol. 6

Enhanced model for determining the number of graphene layers and their distribution from X-ray diffraction data

Andonovic, Beti, Ademi, Abdulakim, Grozdanov, Anita, Paunović, Perica, Dimitrov, Aleksandar T
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Volume:
6
Language:
english
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.6.216
Date:
November, 2015
File:
PDF, 854 KB
english, 2015
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