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SAE Technical Paper Series [SAE International SAE 2003 World Congress & Exhibition - (MAR. 03, 2003)] SAE Technical Paper Series - Coupling Meshfree Methods with Reliability Analysis Techniques
Kloess, Artemis, Wang, Hui-Ping, Botkin, Mark E.Volume:
1
Year:
2003
Language:
english
DOI:
10.4271/2003-01-0145
File:
PDF, 387 KB
english, 2003