SAE Technical Paper Series [SAE International WCX™ 17: SAE World Congress Experience - (APR. 04, 2017)] SAE Technical Paper Series - Ride Analysis under a Random Road Model with Interval Parameters
Feng, Xingxing, Xu, Peijun, Fu, Penglei, Zhang, YunqingVolume:
1
Year:
2017
Language:
english
DOI:
10.4271/2017-01-0415
File:
PDF, 1.23 MB
english, 2017