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Negative bias temperature instability in SOI-like p-type metal oxide semiconductor devices
Li, Lijie, Shan, Chan, Wang, Ying, Luo, XinVolume:
13
Language:
english
Journal:
Micro & Nano Letters
DOI:
10.1049/mnl.2018.0012
Date:
August, 2018
File:
PDF, 286 KB
english, 2018