Comprehensive Investigations on Degradations of Dynamic...

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IEEE Transactions on Power Electronics 2018

Comprehensive Investigations on Degradations of Dynamic Characteristics for SiC Power MOSFETs under Repetitive Avalanche Shocks

Wei, Jiaxing, Liu, Siyang, Li, Sheng, Fang, Jiong, Li, Ting, Sun, Weifeng
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/TPEL.2018.2843559
File:
PDF, 1.73 MB
english, 2018
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