The Impact of the Shallow-Trench Isolation Effect on...

Journal of Nanoscience and Nanotechnology 2018 / 06 Vol. 18; Iss. 6

The Impact of the Shallow-Trench Isolation Effect on Flicker Noise of Source Follower MOSFETs in a CMOS Image Sensor

Fan, C. C, Chiu, Y. C, Liu, C, Lai, W. W, Cheng, C. H, Lin, D. L, Li, G. R, Lo, Y. H, Chang, C. W, Tsai, C. C, Chang, C. Y
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Volume:
18
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2018.15239
Date:
June, 2018
File:
PDF, 909 KB
english, 2018
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