Multifrequency Kelvin Probe Force Microscopy on self...

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Ultramicroscopy 2018 / 8

Multifrequency Kelvin Probe Force Microscopy on self assembled molecular layers and quantitative assessment of images’ quality

Kopiec, Daniel, Jóźwiak, Grzegorz, Moczała, Magdalena, Sierakowski, Andrzej, Gotszalk, Teodor
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Language:
english
Journal:
Ultramicroscopy
DOI:
10.1016/j.ultramic.2018.08.002
Date:
August, 2018
File:
PDF, 1.24 MB
english, 2018
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