Remaining Useful Life Estimation of Insulated Gate Biploar...

Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra k-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data

Liu, Zhen, Mei, Wenjuan, Zeng, Xianping, Yang, Chenglin, Zhou, Xiuyun
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Volume:
17
Language:
english
Journal:
Sensors
DOI:
10.3390/s17112524
Date:
November, 2017
File:
PDF, 6.53 MB
english, 2017
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