A review of demodulation techniques for amplitude-modulation atomic force microscopy
Ruppert, Michael G, Harcombe, David M, Ragazzon, Michael R P, Moheimani, S O Reza, Fleming, Andrew JVolume:
8
Language:
english
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.8.142
Date:
July, 2017
File:
PDF, 7.33 MB
english, 2017