Effect of lanthanum silicate interface layer on the...

Effect of lanthanum silicate interface layer on the electrical characteristics of 4H-SiC metal-oxide-semiconductor capacitors

Lei, Y.M., Wakabayashi, H., Tsutsui, K., Iwai, H., Furuhashi, M., Tomohisa, S., Yamakawa, S., Kakushima, K.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
84
Language:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2018.03.037
Date:
May, 2018
File:
PDF, 928 KB
english, 2018
Conversion to is in progress
Conversion to is failed