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Insights into Texture and Phase Coexistence in Polycrystalline and Polyphasic Ferroelectric HfO2 Thin Films using 4D-STEM
Grimley, Everett D., Frisone, Sam, Schenk, Tony, Park, Min Hyuk, Fancher, Chris M., Mikolajick, Thomas, Jones, Jacob L., Schroeder, Uwe, LeBeau, James M.Volume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927618001411
Date:
August, 2018
File:
PDF, 2.12 MB
english, 2018