Secondary Ion Mass Spectrometry on the Helium Ion...

Secondary Ion Mass Spectrometry on the Helium Ion Microscope: methodologies for analysis of nanomaterials

Audinot, Jean-Nicolas, Vollnhals, Florian, Gratia, Paul, Eswara, Santhana, Philipp, Patrick, Wirtz, Tom
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Volume:
24
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927618005573
Date:
August, 2018
File:
PDF, 155 KB
english, 2018
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