Evaluation of subsurface damage inherent to polished GaN...

Evaluation of subsurface damage inherent to polished GaN substrates using depth-resolved cathodoluminescence spectroscopy

Lee, Jinhyung, Kim, Jong Cheol, Kim, Jongsik, Singh, Rajiv K., Arjunan, Arul C., Lee, Haigun
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Volume:
660
Language:
english
Journal:
Thin Solid Films
DOI:
10.1016/j.tsf.2018.07.002
Date:
August, 2018
File:
PDF, 1.56 MB
english, 2018
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