![](/img/cover-not-exists.png)
A Normalized Quantitative Method for GaN HEMT Turn on Overvoltage Modeling and Suppressing
Xiao, Long, Wu, Liang, Zhao, Jun, Guozhu, ChenYear:
2018
Language:
english
Journal:
IEEE Transactions on Industrial Electronics
DOI:
10.1109/TIE.2018.2842768
File:
PDF, 1.82 MB
english, 2018