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SAE Technical Paper Series [SAE International SAE World Congress & Exhibition - (APR. 14, 2008)] SAE Technical Paper Series - Methodology for IP Module Design using Tests and CAE
Kim, Hyun, Yun, Jung-Hwan, Kim, Joo-Ha, Jeong, Hee-JunVolume:
1
Year:
2008
Language:
english
DOI:
10.4271/2008-01-0870
File:
PDF, 256 KB
english, 2008