![](/img/cover-not-exists.png)
[IEEE 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Florence, Italy (2018.5.27-2018.5.30)] 2018 IEEE International Symposium on Circuits and Systems (ISCAS) - Evaluation of SRAM V min shift induced by random telegraph noise (RTN): physical understanding and prediction method
Guo, Shaofeng, Lin, Zhenghan, Wang, Runsheng, Mao, Dongyuan, Wang, Yangyuan, Huang, RuYear:
2018
Language:
english
DOI:
10.1109/ISCAS.2018.8351499
File:
PDF, 774 KB
english, 2018