[IEEE 2018 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) - Roma (2018.5.22-2018.5.25)] 2018 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP) - Life time assessment of microelectrodes for neural stimulation applications
Losada, Pedro Gonzalez, Grzeskowiak, Marjorie, Rousseau, Lionel, Lissorgues, Gaelle, Scorsone, EmmanuelYear:
2018
Language:
english
DOI:
10.1109/DTIP.2018.8394229
File:
PDF, 1.44 MB
english, 2018