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[IEEE 2018 IEEE International Memory Workshop (IMW) - Kyoto (2018.5.13-2018.5.16)] 2018 IEEE International Memory Workshop (IMW) - Study of Counter-Pulse (CP) Programming Method to Improve the Vt Distribution for 3D Charge-Trapping NAND Flash Devices
Lee, Yung Chun, Chen, Wei-Chen, Lue, Hang-Ting, Hsieh, Chih-Chang, Chang, Kuo-Ping, Lin, Ping-Hsien, Li, Hsiang-Pang, Wang, Keh-Chung, Lu, Chih-YuanYear:
2018
Language:
english
DOI:
10.1109/IMW.2018.8388850
File:
PDF, 1.24 MB
english, 2018