[IEEE 2018 IEEE International Conference on Software Quality, Reliability and Security (QRS) - Lisbon, Portugal (2018.7.16-2018.7.20)] 2018 IEEE International Conference on Software Quality, Reliability and Security (QRS) - Cross-Entropy: A New Metric for Software Defect Prediction
Zhang, Xian, Ben, Kerong, Zeng, JieYear:
2018
Language:
english
DOI:
10.1109/QRS.2018.00025
File:
PDF, 869 KB
english, 2018