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As-grown-Generation Model for Positive Bias Temperature...

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IEEE Transactions on Electron Devices 2018

As-grown-Generation Model for Positive Bias Temperature Instability

Gao, Rui, Ji, Zhigang, Zhang, Jian Fu, Marsland, John, Zhang, Wei Dong
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2018.2857000
File:
PDF, 2.29 MB
english, 2018
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