EIS, Mott Schottky and EFM analysis of the electrochemical...

EIS, Mott Schottky and EFM analysis of the electrochemical stability and dielectric properties of Ca-P-Ag and Ca-P-Si-Ag coatings obtained by plasma electrolytic oxidation in Ti6Al4V

Leal-Marin, Sara María, Estupiñán-Duran, Hugo Armando
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Journal:
Revista Facultad de Ingeniería Universidad de Antioquia
DOI:
10.17533/udea.redin.n83a02
Date:
June, 2017
File:
PDF, 3.59 MB
2017
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