Structural characteristics of SiGe/Si materials...

Structural characteristics of SiGe/Si materials investigated by raman spectroscopy

ChangChun Chen, BenHai Yu, Jiangfeng Liu, QiRun Dai
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Volume:
11
Language:
english
Pages:
5
DOI:
10.1007/bf03027329
Date:
August, 2005
File:
PDF, 511 KB
english, 2005
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