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Effect of oxygen content on the electrical properties of sputter deposited vanadium oxide thin-films
Rakshit, Abhishek, Mukherjee, Manabendra, Chakraborty, SupraticVolume:
88
Language:
english
Journal:
Materials Science in Semiconductor Processing
DOI:
10.1016/j.mssp.2018.07.040
Date:
December, 2018
File:
PDF, 515 KB
english, 2018