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[IEEE 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Austin, TX (2018.3.19-2018.3.22)] 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) - Efficient parameter-extraction of SPICE compact model through automatic differentiation
Shintani, Michihiro, Hiromoto, Masayuki, Sato, TakashiYear:
2018
Language:
english
DOI:
10.1109/ICMTS.2018.8383759
File:
PDF, 380 KB
english, 2018