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Analytical Methodology for Loss Calculation of SiC MOSFETs
Wang, Xudong, Zhao, Zhengming, Li, Kai, Zhu, Yicheng, Chen, KainanYear:
2018
Language:
english
Journal:
IEEE Journal of Emerging and Selected Topics in Power Electronics
DOI:
10.1109/JESTPE.2018.2863731
File:
PDF, 851 KB
english, 2018