Direct characterization of the evanescent field in objective-type total internal reflection fluorescence microscopy
Niederauer, Christian, Blumhardt, Philipp, Mücksch, Jonas, Heymann, Michael, Lambacher, Armin, Schwille, PetraVolume:
26
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.26.020492
Date:
August, 2018
File:
PDF, 20.09 MB
english, 2018