Direct characterization of the evanescent field in...

Direct characterization of the evanescent field in objective-type total internal reflection fluorescence microscopy

Niederauer, Christian, Blumhardt, Philipp, Mücksch, Jonas, Heymann, Michael, Lambacher, Armin, Schwille, Petra
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Volume:
26
Language:
english
Journal:
Optics Express
DOI:
10.1364/OE.26.020492
Date:
August, 2018
File:
PDF, 20.09 MB
english, 2018
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