Comparison of Models and Whole-Genome Profiling Approaches...

Comparison of Models and Whole-Genome Profiling Approaches for Genomic-Enabled Prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and Tan Spot Resistance in Wheat

Juliana, Philomin, Singh, Ravi P., Singh, Pawan K., Crossa, Jose, Rutkoski, Jessica E., Poland, Jesse A., Bergstrom, Gary C., Sorrells, Mark E.
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Volume:
10
Year:
2017
Language:
english
Journal:
The Plant Genome
DOI:
10.3835/plantgenome2016.08.0082
File:
PDF, 2.85 MB
english, 2017
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