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Multitrait, Random Regression, or Simple Repeatability Model in High-Throughput Phenotyping Data Improve Genomic Prediction for Wheat Grain Yield
Sun, Jin, Rutkoski, Jessica E., Poland, Jesse A., Crossa, José, Jannink, Jean-Luc, Sorrells, Mark E.Volume:
10
Year:
2017
Language:
english
Journal:
The Plant Genome
DOI:
10.3835/plantgenome2016.11.0111
File:
PDF, 1.18 MB
english, 2017