[IEEE 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC) - Mie (2018.4.17-2018.4.21)] 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference (ICEP-IAAC) - High spatial-resolution X-ray inspection by pixelated scintillator
Miyao, Sho, Tanino, Takahiro, Fujioka, Nobuyasu, Hikita, Izumi, Morinaga, Tomohiro, Kodama, Haruhito, Okamura, Masaki, Shigeta, KazukiYear:
2018
Language:
english
DOI:
10.23919/ICEP.2018.8374703
File:
PDF, 17.24 MB
english, 2018