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Buffer Induced Current-Collapse in GaN HEMTs on Highly Resistive Si Substrates
Chandrasekar, Hareesh, Uren, Michael J., Eblabla, Abdalla, Hirshy, Hassan, Casbon, Michael A., Tasker, Paul J., Elgaid, Khaled, Kuball, MartinYear:
2018
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2018.2864562
File:
PDF, 680 KB
english, 2018