Effect of electric field on migration of defects in oxides: Vacancies and interstitials in bulk MgO
El-Sayed, Al-Moatasem, Watkins, Matthew B., Grasser, Tibor, Shluger, Alexander L.Volume:
98
Language:
english
Journal:
Physical Review B
DOI:
10.1103/PhysRevB.98.064102
Date:
August, 2018
File:
PDF, 1.89 MB
english, 2018