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[IEEE 2018 IEEE 27th International Symposium on Industrial Electronics (ISIE) - Cairns, Australia (2018.6.13-2018.6.15)] 2018 IEEE 27th International Symposium on Industrial Electronics (ISIE) - Challenges of In-Situ Thermal Characterization of Thin-Film Isolation Layers for Printed Electronics
Steiner, Harald, Sauter, Thilo, Schlauf, Marlies, Schalkhammer, Thomas, Fuhringer, Roman, Kieslinger, DietmarYear:
2018
DOI:
10.1109/ISIE.2018.8433750
File:
PDF, 377 KB
2018