Electronic imaging of subcritical defect accumulation in single crystal silicon under fatigue loading
Kamiya, Shoji, Kongo, Akira, Sugiyama, Hiroko, Izumi, HayatoVolume:
279
Language:
english
Journal:
Sensors and Actuators A: Physical
DOI:
10.1016/j.sna.2018.06.016
Date:
August, 2018
File:
PDF, 2.74 MB
english, 2018